IBM®
Skip to main content
    Zurich Research Laboratory      Terms of use
 
 
 
     Home      Products      Services & solutions      Support & downloads      My account     
IBM Research

Interferometric detection of spin transport in a Schottky barrier

Project overview

Time-resolved measurements of spin transport performed on metal/oxide/semiconductor planar structures reveal that the Kerr rotation, arising from the polarized electrons injected in the depletion layer of the semiconductor, is modulated by the distance of these electrons to the metal-semiconductor interface. The time-resolved Kerr signal exhibits fast oscillations, in the range of a few up to ca. 100 ps. These oscillations originate, in a Fabry-Perot interferometer manner, from the interference between the light reflected from the metalized semiconductor surface and from the front of the electron distribution photoexcited by the pump light pulse. This effect allows one to study in a direct manner the dynamics of photogenerated charge carriers in the depletion layer of the biased Schottky barrier.

Principle of the experiment
Principle of experiment
Images, click to enlarge
Example of the time-dependent Kerr rotation as a function of the bias applied to the Schottky barrier (a) without an external magnetic field and (b) for a magnetic field of 1 T.
Kerr rotation
Thickness of the Schottky barrier depletion layer vs. applied bias voltage, determined from the oscillating behavior of the time-dependent Kerr signal.
Schottky barrier
    back to top
     
    About IBM Privacy Contact