External disturbances
Internal disturbances
Projects & tools

Characterization. Transmission electron microscopy system

Characterization. Spin-polarized scanning electron microscopy system

Characterization. Raman microscopy system

Fabrication. Electron-beam lithography system
Characterization. Transmission electron microscopy system
Characterization. Spin-polarized scanning electron microscopy system
Characterization. Raman microscopy system
Fabrication. Electron-beam lithography system
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Fact Sheet Nanotechnology Center [E | D]
Fact Sheet Noise-Free Labs [E | D]
Specifications of noise-free labs
Parameter | Value |
---|---|
Temperature stability (at rest) | ± 0.01 °C / 24 h |
Humidity fluctuation | < 3% |
Vibrations (RMS, 1/3 octave) |
˂ 100 nm/s @ 1 Hz |
Acoustic noise (RMS, 1/3 octave) |
˂ 21 dBC |
Electromagnetic fields | ˂ 2 nT (AC) (absolute) < 20 nT (DC) (fluctuations only) |