External disturbances

External disturbances

Internal disturbances

External disturbances

Reproduced by permission of The Royal Society of Chemistry

 

Projects & tools

TEM

Characterization. Transmission electron microscopy system

SEM

Characterization. Spin-polarized scanning electron microscopy system

Raman Microscopy system

Characterization. Raman microscopy system

Electron-beam lithography system

Fabrication. Electron-beam lithography system

Questions? Contact the expert


Interested in licensing?

Our noise-free lab concept is available for licensing. Please contact us for more details.


Downloads

Fact Sheet Nanotechnology Center [E | D]
Fact Sheet Noise-Free Labs [E | D]


Specifications of noise-free labs

Parameter Value
The noise-free laboratories achieve the following specifications, certified by independent external companies.
Temperature stability (at rest) ± 0.01 °C / 24 h
Humidity fluctuation < 3%
Vibrations
(RMS, 1/3 octave)
˂ 100 nm/s @ 1 Hz
Acoustic noise
(RMS, 1/3 octave)
˂ 21 dBC
Electromagnetic fields ˂ 2 nT (AC) (absolute)
< 20 nT (DC) (fluctuations only)
Noise-free labs
Noise-free labs
Noise-free labs
Noise-free labs
Noise-free labs
Noise-free labs
Noise-free labs
Noise-free labs
Noise-free labs
Noise-free labs
Noise-free labs
Noise-free labs
Noise-free labs
Noise-free labs


Virtual tour

Step inside and take a look around

360-deg view of noise-free labs

Raman microscopy system.

360-deg view of noise-free labs

Spin-polarized scanning electron microscopy system.

BBC Arabic interviews IBM Researcher Emanuel Lörtscher

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