8:15 |
Transfer from Hotel to IBM Research Europe - Zurich |
8:30 |
Registration and Welcome Coffee |
9:00 |
Morning Session IA- Impact of materials / fabrication / device design on noise
origin of noise sources / noise in MOS vs. heterostructures / role of defects, amorphous materials, dopants, valley splitting, nuclear spins
- Andreas Fuhrer & Guido Burkard - Welcome & Introduction
- Giordano Scappucci - Is charge noise in quantum dots related to 2D quantum transport?
- Dominique Bougeard - Spin Qubit in MBE 28Si/SiGe with 60 ppm 29Si
- George Simion - Charges, low frequency electric noise and quantum gate fidelities
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10:40 |
Break & Discussion |
11:00 |
Morning Session IB- Impact of materials / fabrication / device design on noise
origin of noise sources / noise in MOS vs. heterostructures / role of defects, amorphous materials, dopants, valley splitting, nuclear spins
- Matthias Urdampiletta - Charge Noise in nMOS devices probed by tunneling spectroscopy and spin-valley mixing
- Samuel Whiteley - Triple-quantum-dot charge noise in Si/SiGe
- Mark Eriksson - 1/f and 1/f2 noise in Si/SiGe gate-defined quantum dot qubits
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12:45 |
Lunch |
14:00 |
Afternoon Session IIA- Measurement / characterization of noise and coherence
noise spectroscopy / quantitative comparisons of noise / linking RT properties to cryogenic characteristics
- Summary Session I & Discussion
- Andreas Kuhlmann - Hole spin qubits in silicon fin field-effect transistors
- Thomas Watson - Measuring charge noise on the fly
- Cedric Corley-Wiciak - Mapping of the 3D strain tensor around spin qubits by X-ray nanoprobe and its impact on local band energy level variations
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16:00 |
Break & Discussion |
16:30 |
Afternoon Session IIB-
noise spectroscopy / quantitative comparisons of noise / linking RT properties to cryogenic characteristics
- Łukasz Cywiński - Characterization of spatio-temporally correlated noise
- John Nichol - Charge noise in silicon qubits
- Thomas Ihn - Measuring charge noise acting on semiconductor quantum dots in transport and using the circuit QED architecture
- Pasquale Scarlino - In-situ tuning of the electric dipole strength of a double dot charge qubit: charge noise protection
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18:30 |
Dinner at IBM Research |