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Nanowire devices

Overview

The electrical properties of different kind of architectures as well as different transistor structures based on Si nanwires are investigated in this project. The two different approaches used are the vertical and the lateral transistors.

Lateral nanowire FETs

Figure 1 demonstrates the inversion in a lateral Si-nanowire FET. This was the first successful demonstration of implantation for ohmic contact formation in Si-nanowires [1].

Vertical Schottky barrier FETs

We demonstrated the first vertical surround-gate Si-nanowire transistor, see Figure 2. A surround-gate allows the optimal electrostatic control over the channel [2].

Steep slope devices – IMOS FETs

We demonstrated vertically standing, epitaxial, individual silicon nanowire field effect transistors at room temperatures, with sub-threshold slopes as low as 5 mV/decade over four orders of magnitude in current. The sub-threshold slope is a measure for the voltage needed to switch a transistor between its “on” and “off” state. In conventional transistors, the lower limit of the sub-threshold slope is 60 mV/decade at room temperature. The transistors demonstrated here make use of the internal gain of an avalanche multiplication of charge carriers. Our device represents an important advancement in pushing the limits of device performance towards extremely low-power operation. The results have been published in Applied Physics Letters [3].

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References

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Images

Lateral and vertical FET architectures

click to enlargeFigure 1. Lateral nanowire FETs.



TEM

click to enlargeFigure 2. Vertical Schottky barrier FETs.



IMOS MOSFET

click to enlargeFigure 3. Nanowire field effect impact ionization MOSFET with ultralow sub-threshold slope. The device can be operated as an SB-MOSFET as well as in the impact ionization mode.