Overview
The electrical properties of different kind of architectures as well as different transistor structures based on Si nanwires are investigated in this project. The two different approaches used are the vertical and the lateral transistors.
Lateral nanowire FETs
Figure 1 demonstrates the inversion in a lateral Si-nanowire FET. This was the first successful demonstration of implantation for ohmic contact formation in Si-nanowires [1].
Vertical Schottky barrier FETs
We demonstrated the first vertical surround-gate Si-nanowire transistor, see Figure 2. A surround-gate allows the optimal electrostatic control over the channel [2].
Steep slope devices – IMOS FETs
We demonstrated vertically standing, epitaxial, individual silicon nanowire field effect transistors at room temperatures, with sub-threshold slopes as low as 5 mV/decade over four orders of magnitude in current. The sub-threshold slope is a measure for the voltage needed to switch a transistor between its “on” and “off” state. In conventional transistors, the lower limit of the sub-threshold slope is 60 mV/decade at room temperature. The transistors demonstrated here make use of the internal gain of an avalanche multiplication of charge carriers. Our device represents an important advancement in pushing the limits of device performance towards extremely low-power operation. The results have been published in Applied Physics Letters [3].
References
- O. Hayden, M. T. Björk, H. Schmid, H. Riel, U. Drechsler, S.F. Karg, E. Lörtscher, W. Riess, Fully-Depleted Nanowire Field Effect Transistor in Inversion Mode, Small 3, 230 (2007).
- V. Schmidt, H. Riel, S. Senz, S. Karg, W. Riess, U. Gösele, Realization of a Silicon Nanowire Vertical Surround-Gate Field-Effect Transistor, Small 2(1) (January 2006) 85-88 (published online: 7 Nov 2005).
- M.T. Björk, O. Hayden, H. Schmid, H. Riel, W. Riess, Vertical Surround-Gated Silicon Nanowire Impact Ionization Field-Effect Transistors, Appl. Phys. Lett. 90, 142110 (2007).

